CRYOGENIC PROBE STATIONS

Temperature-dependent characterization of new semiconductor devices and materials can yield important understanding about defects and basic conductivity mechanisms. At very low temperatures, thermally activated carriers are essentially immobilized, allowing the inherent electronic transport properties of the material to be revealed. A cryogenic probe station provides the necessary level of environmental control for accurate and repeatable variable-temperature measurements.

Cryogenic probe systems supplied by Rotalab are cost effective alternatives to high-priced vacuum based probing systems. With up to five probes available and sample diameters up to six inches, our cryogenic probe stations allow for electrical measurements at temperatures (~77K) near liquid nitrogen levels.

  • Model 441

    MATERIALS DEVELOPMENT CORPORATION (MDC)
    Cryogenic Probe Station
    Cryogenic Probing System
  • Model CG-196

    EVERBEING INTERNATIONAL CORPORATION
    Cryogenic Probe Station
    Cryogenic Probing System