MANUAL PROBE STATIONS

A probe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of the semiconductor device. If the device is being electrically stimulated, the signal is acquired by the mechanical probe and is displayed on an oscilloscope.

Probe stations enable physical scientists and researchers to conduct fundamental science through convenient, repeatable measurements producing consistent results. Probe stations are versatile and flexible research platforms that can support a wide variety of applications such as I-V/C-V, radio frequency (RF), millimeter-wave (mmW) and sub-THz measurements, device and wafer characterization tests (DWC), wafer level reliability, failure analysis (FA), modeling, yield enhancement, submicron probing, MEMS, optoelectronic engineering tests and more.

Rotalab provides manual probe systems with probing capabilities ranging from 50 mm to 450 mm wafers/substrates. Our wafer prober systems are integrated with state-of-the-art technology to allow you to work efficiently and effectively for your research and industrial applications.

  • PS4L M-4
    [100 mm chuck]

    SEMIPROBE
    Manual Probe Station
    100mm Manual Wafer Probing System
  • PS4L M-6
    [150 mm chuck]

    SEMIPROBE
    Manual Probe Station
    150mm Manual Wafer Probing System
  • PS4L M-8
    [200 mm chuck]

    SEMIPROBE
    Manual Probe Station
    200mm Manual Wafer Probing System
  • PS4L M-12
    [300 mm chuck]

    SEMIPROBE
    Manual Probe Station
    300mm Manual Wafer Probing System
Economical Probe Stations (Lab Assistant Series)
  • LA-50 DC
    [50 mm chuck]

    SEMIPROBE
    Manual Probe Station
    50mm Manual Wafer Probing System
  • LA-50 HF
    [50 mm chuck]

    SEMIPROBE
    Manual Probe Station
    50mm Manual Wafer Probing System
  • LA-100 DC
    [100 mm chuck]

    SEMIPROBE
    Manual Probe Station
    100mm Manual Wafer Probing System
  • LA-100 HF
    [100 mm chuck]

    SEMIPROBE
    Manual Probe Station
    100mm Manual Wafer Probing System
  • LA-150 DC
    [150 mm chuck]

    SEMIPROBE
    Manual Probe Station
    150mm Manual Wafer Probing System
  • LA-150 HF
    [150 mm chuck]

    SEMIPROBE
    Manual Probe Station
    150mm Manual Wafer Probing System
  • LA-200 DC
    [200 mm chuck]

    SEMIPROBE
    Manual Probe Station
    200mm Manual Wafer Probing System
  • LA-200 HF
    [200 mm chuck]

    SEMIPROBE
    Manual Probe Station
    200mm Manual Wafer Probing System
Specialty Probe Stations
  • DSP M
    [double sided prober]

    SEMIPROBE
    Manual Simultaneous Double Sided Probe Station
    Manual Simultaneous Double Sided Wafer Probing System