Rotalab's in-situ systems can measure any translucent film quickly and reliably. Our systems can track and control film thickness, reflectance, deposition rates during Metal Organic Chemical Vapour Deposition (MOCVD), sputtering, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time.

All desktop film thickness measurement instruments provided by Rotalab can connect to the USB port of your Windows™ or Mac™ OS based computer and sets up in minutes.

  • MProbe® In-Situ

    In-Situ Fiberoptics System
    Real-time Spectroscopic Reflectometer