MICROSCOPIC-SPOT MEASUREMENT SYSTEMS

The microscopic-spot product family is for applications that require measurement of spots with sizes less than 4 micron (µm). Our systems can analyze up to more than one-million spots. Thickness and refractive index can still be measured in less than a second. You can use your own microscope for measurements or let us supply the entire system.

All desktop film thickness measurement instruments provided by Rotalab can connect to the USB port of your Windows™ or Mac™ OS based computer and sets up in minutes.

  • MProbe® 40
    [UV-Vis-NIR]

    SEMICONSOFT
    Micro-Spot Reflectometer
    Desktop Reflectometry Instrument
Accessories
  • Motorized XY Mapping Stage

    SEMICONSOFT
    Automated Mapping System
    Thin Film Measurement Accessory