Rotalab provides a wide variety of tabletop thin film thickness measurement systems for single-spot applications. Our products can measure thin-film thickness by analyzing how the film reflects light with a single mouse click. Thin film structures as thin as 1 nm and as thick as 1 mm can be measured - even within multilayer film stacks. And, because there are no moving parts, results are available in seconds: film thickness, color, refractive index, and even roughness.

All desktop thin film thickness measurement instruments provided by Rotalab can connect to the USB port of your Windows™ or Mac™ OS based computer and sets up in minutes.

  • MProbe® 20

    Spectroscopic Reflectometer
    Desktop Reflectometry Instrument
  • Motorized XY Mapping Stage

    Automated Mapping System
    Thin Film Measurement Accessory